Band engineered semiconductor device and method for manufacturing thereof

ABSTRACT

The disclosure is related to a band engineered semiconductor device comprising a substrate, a protruding structure that is formed in a recess in the substrate and is extending above the recess having a buried portion and an extended portion, and wherein at least the extended portion comprises a semiconductor material having an inverted ‘V’ band gap profile with a band gap value increasing gradually from a first value at lateral edges of the structure to a second value, higher than the first value, in a center of the structure. The disclosure is also related to the method of manufacturing of such band engineered semiconductor device.

CROSS REFERENCE TO RELATED APPLICATIONS

Pursuant to the provisions of 35 U.S.C. §119(e), this application claimspriority to U.S. Provisional Patent Application Ser. No. 61/701,452,which was filed Sep. 14, 2012, the entire contents of which areincorporated herein by reference.

FIELD OF THE DISCLOSURE

The present invention is related to a band engineered semiconductordevice, more specifically with a FinFET device and the method ofmanufacturing thereof.

BACKGROUND OF THE DISCLOSURE

Continued scaling of planar MOSFET transistors give rise to increasedshort channel effects. This has sparked interest in alternativetransistor architectures, such as Silicon-On-Insulator FETs, QuantumWell (QW)-based FETs (such as e.g. the implant free quantum well IFQWpFET) and multi-gate FETs (MUGFETs or FinFETs).

However there is further need to improve the performance of the newtransistor architectures with respect to the short channel control inorder to reduce the OFF-state leakage current.

SUMMARY OF THE DISCLOSURE

In a first aspect, the disclosure is related to a semiconductor devicecomprising a substrate and a protruding structure which is formed in arecess in the substrate and is extending above the recess having aburied portion and an extended portion, and wherein at least theextended portion comprises a semiconductor material having an inverted‘V’ band gap profile with a band gap value increasing gradually from afirst value at lateral edges of the structure to a second value, higherthan the first value, in a center of the structure.

In embodiments of the disclosure, both the extended portion and theburied portion comprise a semiconductor material having an inverted ‘V’band gap profile.

In embodiments of the disclosure, the recess has a bottom area whichexposes the substrate and lateral walls comprising a dielectricmaterial.

In some embodiments of the disclosure, the semiconductor material of theprotruding structure comprises silicon germanium (SiGe) and the band gapprofile is created by a gradient in Ge concentration, with the highestGe concentration at the lateral edges of the protruding structure.

In embodiments of the disclosure, Ge concentration at the lateral edgesis between 60 at % and 100 at %.

Further, in embodiments of the disclosure, Ge concentration in thecenter is between 40 at % and 60 at %.

In embodiments of the disclosure, the substrate is silicon and thedielectric material is silicon oxide.

In embodiments of the disclosure, the semiconductor material may furthercomprise dopants.

Furthermore, the protruding structure may comprise two or more layers,the layers being stacked vertically and each layer may comprise asemiconductor material having an inverted ‘V’ band gap profile with aband gap value increasing gradually from a first value at the lateraledges of the structure to a second value higher than the first value inthe center of the structure.

In various embodiments of the disclosure, the protruding structure formsa fin.

In particular embodiments of the disclosure, the fin has a tapered shapehaving a smaller width at a top of the extended portion.

In specific embodiments, the fin may further comprise a capping layerformed conformal around the extended portion of the protrudingstructure.

In particular embodiments, the capping layer is made of SiGe or Ge,wherein SiGe has a Ge concentration higher than 60 at %.

Further, the device of the disclosure may comprise a multiple gateformed conformal around the fin.

In a second aspect, the disclosure is related to a method formanufacturing a semiconductor device comprising a number of steps. Themethod comprises providing a patterned substrate comprising dielectricregion and a semiconductor region. The method also comprises forming arecess in the semiconductor region having a bottom area exposing thesubstrate and lateral walls comprising a dielectric material. The methodfurther comprises forming protruding structures in the recess by growingepitaxial a semiconductor material in the recess filling and overgrowingthe recess. The method even further comprises recessing back thedielectric material in the dielectric region revealing an extendedportion of the protruding structures, wherein at least the extendedportion of the protruding structures comprises a semiconductor materialhaving an inverted ‘V’ band gap profile with a band gap value increasinggradually from a first value at lateral edges of the structure to asecond value higher than the first value in a center of the structure.

The method further comprises performing chemical mechanical polishing toremove any overgrown semiconductor material before recessing back thedielectric material in the dielectric region.

In different embodiments of the disclosure, the semiconductor materialis silicon germanium (SiGe) and the band gap profile is created by agradient in Ge concentration, with the highest Ge concentration at thelateral edges of the protruding structure.

In embodiments of the disclosure, the pressure and the growthtemperature during the epitaxial growth of the SiGe are chosen such thata growth front perpendicular to the (111) planes is favored, therebyforming facets at the bottom area of the recess and wherein the facetspropagate, but do not completely merge in order to keep a (100) top planduring the epitaxial growth thereby achieving a gradient in Geconcentration.

In specific embodiments, the growth temperature is between about 450° C.and about 700° C. and the pressure is between about STorr to about 1atm.

In particular embodiments, the method may further comprise forming acapping layer conformal around the extended portion of the protrudingstructure. Preferably, the capping layer is made of Ge or SiGe with a Geconcentration higher than 60 at %.

In embodiments of the disclosure, the semiconductor material furthercomprises dopants which are introduced by in-situ doping during theepitaxial growth or by implantation after the epitaxial growth.

The method of the disclosure may further comprise forming a gatedielectric and a gate electrode substantially conformal around theextended portion of the protruding structures.

BRIEF DESCRIPTION OF THE DRAWINGS

All drawings are intended to illustrate some aspects and embodiments ofthe present disclosure. The drawings described are only schematic andare non-limiting.

FIG. 1 shows schematically a cross-section through a fin structureaccording to the disclosure. The band gap has an inverted ‘V’ profile,i.e., gradually increasing from the edges of the fin to the center ofthe fin (top picture). The valence band (Ev) energy offset is shown(center plot). A double-gate transistor formed around a fin structure ofthe disclosure (bottom picture) is also shown.

FIG. 2 shows a Transmission Electron Microscopy (TEM) image and ScanningTransmission Electron Microscopy (STEM) image of a structure (fin) grownaccording to the method of the disclosure.

FIG. 3 shows a TEM-image of the structure of the disclosure (right) andthe variation of the Ge concentration percentage across the fin width asmeasured by Energy Dispersive Spectrometry (EDS) (left).

FIG. 4 shows schematically the evolution of the growth plane'sorientation during the epitaxial growth of the semiconductor materialaccording to the method of the disclosure.

FIG. 5 shows schematically a fabrication process according to anembodiment of the disclosure.

FIG. 6 shows schematically a fabrication process according to anotherembodiment of the disclosure.

FIG. 7 shows schematically a fabrication process according to yetanother embodiment of the disclosure.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

The present disclosure relates to a semiconductor device having a bandengineered structure. Further the disclosure relates to a FinFET devicecomprising a band engineered structure and a reduced OFF-state leakagecurrent.

Furthermore, the disclosure relates to a method for manufacturing anelectronic device with a band engineered structure obtained by epitaxialgrowth.

The present disclosure will be described with respect to particularembodiments and with reference to certain drawings, but the disclosureis not limited thereto, but only by the claims. The drawings describedare only schematic and are non-limiting. In the drawings, the size ofsome of the elements may be exaggerated and not drawn on scale forillustrative purposes. The dimensions and the relative dimensions do notcorrespond to actual reductions to practice of the disclosure.

Furthermore, the terms first, second and the like in the description andin the claims are used for distinguishing between similar elements andnot necessarily for describing a sequence, either temporally, spatially,in ranking or in any other manner. It is to be understood that the termsso used are interchangeable under appropriate circumstances and that theembodiments of the disclosure described herein are capable of operationin other sequences than described or illustrated herein.

Moreover, the terms top, under, and the like in the description and theclaims are used for descriptive purposes and not necessarily fordescribing relative positions. It is to be understood that the terms soused are interchangeable under appropriate circumstances and that theembodiments of the disclosure described herein are capable of operationin other orientations than described or illustrated herein.

It is to be noticed that the term “comprising,” used in the claims,should not be interpreted as being restricted to the means listedthereafter; it does not exclude other elements or steps. It is thus tobe interpreted as specifying the presence of the stated features,integers, steps or components as referred to, but does not preclude thepresence or addition of one or more other features, integers, steps orcomponents, or groups thereof. Thus, the scope of the expression “adevice comprising means A and B” should not be limited to devicesconsisting only of components A and B. It means that with respect to thepresent disclosure, the only relevant components of the device are A andB.

Reference throughout this specification to “one embodiment” or “anembodiment” means that a particular feature, structure or characteristicdescribed in connection with the embodiment is included in at least oneembodiment of the present disclosure. Thus, appearances of the phrases“in one embodiment” or “in an embodiment” in various places throughoutthis specification are not necessarily all referring to the sameembodiment, but may. Furthermore, the particular features, structures orcharacteristics may be combined in any suitable manner, as would beapparent to one of ordinary skill in the art from this disclosure, inone or more embodiments.

Similarly it should be appreciated that in the description of exemplaryembodiments of the disclosure, various features of the disclosure aresometimes grouped together in a single embodiment, figure, ordescription thereof for the purpose of streamlining the disclosure andaiding in the understanding of one or more of the various inventiveaspects. This method of disclosure, however, is not to be interpreted asreflecting an intention that the claimed disclosure requires morefeatures than are expressly recited in each claim. Rather, as thefollowing claims reflect, inventive aspects lie in less than allfeatures of a single foregoing disclosed embodiment. Thus, the claimsfollowing the detailed description are hereby expressly incorporatedinto this detailed description, with each claim standing on its own as aseparate embodiment of this disclosure.

Furthermore, while some embodiments described herein include some butnot other features included in other embodiments, combinations offeatures of different embodiments are meant to be within the scope ofthe disclosure, and form different embodiments, as would be understoodby those in the art. For example, in the following claims, any of theclaimed embodiments can be used in any combination.

In the description provided herein, numerous specific details are setforth. However, it is understood that embodiments of the disclosure maybe practiced without these specific details. In other instances,well-known methods, structures and techniques have not been shown indetail in order not to obscure an understanding of this description.

A MUGFET is a widely used abbreviation for a multi-gate fin-type fieldeffect transistor. An example of MUGFET is the FinFET, which ischaracterized by the fact that the conducting channel is wrapped by athin silicon “fin,” which forms the body of the device. The thickness ofthe fin (measured in the direction from source to drain) determines theeffective channel length of the device.

In the technical literature, FinFET is used somewhat generically todescribe any fin-based, multigate transistor architecture regardless ofnumber of gates.

In OFF-state, the current in FinFETs devices flows in the center of thefin. Unfortunately, it is exactly the center of the fin where the gatecontrol is worse. The ON-current in a FinFET flows in a differentlocation, along the fin sidewalls and top, thus much closer to the gate.

Therefore, in a possible solution to lower the OFF-state leakage of afin-based device is to make the center of a fin less conductive and/orto reduce the local carrier concentration in the center of the fin.

One way to reduce the charge density in the middle of the fin is byintroducing a different material in the center of the fin. The centermaterial has a larger band gap than the “cladding” material or, moreprecisely, the center material has a band-offset towards the claddingmaterial. In this way a tri-gate device can be built up around the“cladded” fin. However, from a manufacturing perspective, this is not aneasy structure to make; one has to make a fin of the center materialfirst, and then start growing the second material on top of this whichput a very important challenge to the deposition/growth process.

The present disclosure shows that there is an advantageous alternativefor growing “cladding material” on a center material. This alternativeis a one-step process, whereby a fin is formed in one growth step, witha gradually changing band gap (band offset). The dual-gate transistorcan be formed around the fin structure grown with the method of thedisclosure. Such a transistor has all the benefits of a device buildaround a “cladding” structure and, in addition, other advantages as willbe shown herein below. With some additional manufacturing steps the finstructure can be adapted to form a basis for a tri-gate transistor aswell.

In order to grow the fin with a gradually changing band gap theepitaxial growth process was adapted such that a semiconductor material(e.g., SiGe) is grown in a narrow recess (e.g. STI trench), withlaterally (horizontally) varying concentration. The structure (fin)obtained by such a one-step growth process has a center (middle), whichis Si-rich and edges which are Ge-rich. As a result, holes (h+) will bepresent preferentially in the Ge-rich areas, thus, at the edges and notin the center.

Before forming the gate, the fin obtained with the method of thedisclosure has a buried portion and an extended portion. At least theextended portion has a gradually changing band gap, which increases froma first (lower) value at the lateral edges of the fin to a second(higher) value in the center of the fin. Advantageously, both the buriedportion and the extended portion of the fin obtained with the method ofthe disclosure have the gradually changing band gap which increases froma first (lower) value at the lateral edges of the fin to a second(higher) value in the center of the fin.

In a first aspect of the disclosure, a semiconductor device is disclosedcomprising a substrate and a protruding structure on the substrate,wherein the protruding structure comprises a semiconductor materialhaving an inverted ‘V’ band gap profile with a band gap value increasinggradually from a first value at lateral edges of the structure to asecond value, higher than the first value, in a center of the structure.

Further, in the first aspect the protruding structure is formed in arecess (trench) which has a bottom area exposing the substrate andsidewalls made of an insulating material (dielectric).

After removing the overgrown semiconductor material and recessing backpart of the adjacent (insulating) material, the protruding structure isextending above the remaining recess thereby having a buried portion andan extended portion.

FIG. 1 shows schematically a cross-section through a fin structure ofthe disclosure. The band gap of the grown semiconductor material has aninverted ‘V’ profile, i.e., gradually increasing from the edges of thefin to the center of the fin. The valence band (Ev) energy offset isalso shown. In the bottom picture of FIG. 1 a double-gate transistorformed around a fin structure of the disclosure is schematicallyrepresented. With the label “small E_(G)” it is meant to indicate amaterial with a conduction/valence band offset for electrons/holes, suchthat electrons/holes preferentially occupy said material.

In embodiments of the disclosure, the bottom part of the trench (orrecess) which exposes the substrate can have either a flat surface or aconcave surface as result of the recess forming (etching) process. Assoon as facets are formed during the epitaxial growth a horizontal(lateral) gradient in composition is observed. The horizontal gradientin composition corresponds to a gradient in the band gap of thesemiconductor material.

Embodiments of the disclosure describe a device wherein at least theextended portion of the protruding structure comprises a semiconductormaterial having an inverted ‘V’ band gap profile.

Other embodiments of the disclosure describe a device wherein both theextended portion and the buried portion comprise a semiconductormaterial having an inverted ‘V’ band gap profile.

In different embodiments of the first and second aspect of thedisclosure, the substrate is silicon (e.g., a silicon wafer). Further inthese embodiments, the dielectric material is silicon oxide.Hereinafter, the silicon oxide is also referred to as Shallow TrenchIsolation (STI) oxide (2), since it is originating from a previous STIprocess sequence performed on a bare Si substrate.

In embodiments of the disclosure the semiconductor material of theprotruding structure comprises silicon germanium and the band gapprofile is created by a gradient in Ge concentration, with the highestGe concentration at the lateral edges of the protruding structure.

FIG. 2 shows a Transmission Electron Microscopy (TEM) image and ScanningTransmission Electron Microscopy (STEM) image of a protruding structure(fin) grown according to the method of the disclosure. The lighterportion in the middle of the structure made of SiGe indicates a locallyhigher Si concentration than at the lateral edges of the fin. The dottedwhite rectangle on the left picture indicates the portion around whichthe dual-gate or tri-gate transistor will be formed in the subsequentmanufacturing steps.

FIG. 3 shows a TEM-image of the protruding structure of the disclosure(right) and the variation of the Ge concentration percentage across thefin width as measured by Energy Dispersive Spectrometry (EDS) (left).From the contrast in the right picture it can be noticed that as soon asfacets are formed, Ge lateral gradient is observed. The absolutedifference in Ge concentration between the center of the fin structureand the lateral edges amounts about 40 at %.

In specific embodiments of both aspects of the disclosure, Geconcentration at the lateral edges is comprised between 60 at % and 100at %,

Further, in particular embodiments of both aspects of the disclosure, Geconcentration in the center of the structure is comprised between 40 at% and 60 at %.

In particular embodiments of the disclosure, the semiconductor materialfurther may comprise dopants (5). The dopants (5) can be localized inthe protruding structure as shown in FIG. 6, this configuration bringingadditional advantages as shown below.

Further in embodiments of the disclosure, the semiconductor material ofthe protruding structure may comprise two or more layers, the layersbeing stacked vertically as shown in FIG. 7. Each layer comprises asemiconductor material having a horizontal gradient in band gap,increasing from a first value at the edges to a second (higher) value inthe center of the structure.

In different embodiments, the protruding structure of the disclosureforms a fin (1) in a multi-gate field effect transistor. Such a MUGFETfurther comprises a gate oxide (3) and a gate electrode (4) formedaround the fin (1).

In particular embodiments, the fin has a tapered shape having a smallerwidth at a top of the extended portion.

In embodiments of the disclosure, the fin may further comprise a cappinglayer formed conformal around the extended portion of the protrudingstructure. In particular examples, the capping layer comprises SiGe orGe, wherein SiGe has a Ge concentration higher than 60 at %.

In a second aspect of the disclosure, a method for manufacturing asemiconductor device is disclosed comprising the following steps. First,providing a patterned substrate comprising dielectric region and asemiconductor region. Next, forming a recess in the semiconductor regionhaving a bottom area exposing the substrate and lateral walls(sidewalls) comprising a dielectric material. Then, forming protrudingstructures in the recess wherein the structures comprise a semiconductormaterial having an inverted ‘V’ band gap profile with a band gap valueincreasing gradually from a first value at lateral edges of thestructure to a second value in a center of the structure; the formationof the protruding structures is achieved by growing epitaxial asemiconductor material in the recess filling and overgrowing the recess.The next step in manufacturing a semiconductor device is performingchemical mechanical polishing to remove any overgrown semiconductormaterial. A further step in manufacturing a semiconductor device isrecessing (etching) back the dielectric material in the dielectricregion revealing an extended portion of the protruding structures.

In state of the art epitaxial growth of SiGe it is known how to vary theconcentration of Ge in a vertical direction, e.g., when filling up frombottom to top a trench with increasing Ge concentration. However, such atechnique will create a gradient in Ge concentration only in thevertical direction (a direction parallel to the sidewalls of thetrench).

Referring to the epitaxial growth in the method of the disclosure, thesemiconductor material (in an example SiGe) is grown such that the Geconcentration is varied on a horizontal direction (perpendicular on thesidewalls of the trench). The gradient in the horizontal direction isthe consequence of the lateral growth from a vertical Si seed surface.In order to achieve this, the epitaxial process has to be especiallyadapted as described below.

More specifically, the pressure and the temperature of the epitaxialgrowth process of SiGe are chosen such that a growth front perpendicularto the (111) planes is favored, thereby, forming facets at the bottomarea of the recess (trench). Subsequently, the facets formed at thebottom area of the recess propagate but do not completely merge suchthat a (100) top plan is kept during the epitaxial growth, therebyachieving a gradient in Ge concentration in the horizontal direction. Itis noted that a horizontal Ge gradient is obtained both in the trenchand also on top of the trenches where (100) planes are formed againafter the lateral overgrowth planes merge.

FIG. 4 shows schematically the evolution of the growth planesorientation during the epitaxial growth of SiGe according to the methodof the disclosure.

In embodiments of the first and second aspect of the disclosure, thesemiconductor material comprises at least two group IV elements such asSi, Ge, C, or Sn. Preferably, the semiconductor material comprises Siand Ge. More preferably, the semiconductor material is silicon germanium(SiGe).

Further in other embodiments of the first and second aspect of thedisclosure the semiconductor material comprises an III-V compound.Preferably, the III-V compound is a ternary III-V compound comprisingtwo group III-elements such as In, Ga, or Al and one group V elementsuch as As or P. More preferably, the III-V compound comprises/consistof InGaAs.

In different embodiments of the second aspect, the growth temperature isbetween 450° C. and 700° C. while the total pressure in the epitaxialreactor is between 5 Torr and 1 atm.

In the specific and non-limitative example shown in FIG. 4,dichlorosilane (H₂SiCl₂, DCS) was used as Si precursor and germane(GeH₄) as Ge precursor while H₂ was used as carrier gas. The growthtemperature was 550° C., total pressure in the reactor 20 Torr and theflows of the precursors and carrier gas as following: 20 sccm DCS, 200sccm GeH₄ and 20 slm H₂. The process conditions (temperature and totalpressure in the epitaxial reactor, flows or partial pressures ofprecursors and carrier gas) suitable to grow the semiconductor materialsuch that the growth front perpendicular to the (111) planes is favoredand facets are formed at the bottom area of the recess (trench) can beeasily identified by those skilled in the art for a particular epitaxialreactor based on the present disclosure. Facets formation is especiallyfavored during the epitaxial growth at low pressure and/or hightemperature in the above mentioned ranges.

In various embodiments, the method of the disclosure may furthercomprise the process steps of forming a gate dielectric and gateelectrode substantially conformal around the extended portion of theprotruding structures.

FIG. 5 shows schematically a fabrication process according to anembodiment of the disclosure. The step depicted in (101) shows epitaxialgrowth of a semiconductor material having a horizontal gradient incomposition, e.g., Si-rich SiGe in the center of the structure (“A”) andGe-rich SiGe at the lateral edges of the structure (“B”). The stepillustrated in (102) depicts chemical mechanical processing (CMP) of theovergrown semiconductor material. The step (103) illustrates the STIoxide (2) etch back (recess) to expose the fin (1), the exposed portionof the fin is referred herein also as the extended portion of the fin.The step (104) shows the formation of gate oxide (3) and gate electrode(4) around the fin (1) in a tri-gate architecture. The step (104′) is analternative to the step (104), which shows the formation of gate oxide(3) and gate electrode (4) in a dual-gate architecture.

In reference to gate oxide (3), any high-k dielectric material known inthe art to be suitable to act as gate dielectric can be implemented inthe method of the disclosure. Any metal gate material known in the artto be suitable to act as gate electrode (4) can be implemented in themethod of the disclosure. Both the gate dielectric and the gateelectrode can be formed by a conformal deposition technique such asAtomic Layer Deposition (ALD) with or without vacuum break in between.

In FIG. 5 the center of the structure having a larger band gap islabeled with “A,” while the lateral edges are labeled with “B.” It isimportant to note that this is a schematic representation. In reality,there is no abrupt transition between the band gap value in region/zone“A” of the semiconductor material and the band gap value in region/zone“B” of the same semiconductor material. The band gap variation isgradual and continuous, increasing in a horizontal direction from theedge to the center of the structure and in this way achieving aninverted “V” profile.

In embodiments of the second aspect, the semiconductor material furthercomprises dopants (5), which are introduced by in-situ doping during theepitaxial growth. In alternative embodiments the dopants are introducedby implantation after the epitaxial growth.

FIG. 6 shows schematically a fabrication process according to anembodiment of the disclosure, wherein dopants are introduced duringepitaxial growth. The step depicted in (201) shows epitaxial growth of asemiconductor material with a horizontal gradient in composition, region(5) represents doping introduced during epitaxial growth. The doping hasan abrupt profile intended for s/d isolation (analogue with thefunctionality of the halo implants in planar configurations).Preferentially, the doping is localized at the bottom of the extendedportion of the protruding structure as shown in FIG. 6. The step (202)depicts CMP of the overgrown semiconductor material. The step (203)illustrates the STI oxide (2) etch back (recess) to expose the fin (1).The step (204) shows formation of gate oxide (3) and gate electrode (4)around the fin in a tri-gate architecture. The step (204′) is analternative to step (204), which shows the formation of gate oxide andgate electrode in a dual-gate architecture.

The semiconductor material of the protruding structure may furthercomprise two or more layers, the layers being stacked vertically. Thisembodiment is illustrated in FIG. 7.

FIG. 7 shows schematically a fabrication process according to anembodiment of the disclosure wherein the fin comprises multiple layers(stacked up vertically) having different compositions, at least one ofthe layers having a horizontal gradient in composition. Preferably, allthe layers (e.g., in this example both layers) have a horizontalgradient in composition. Preferably, the layers are formed by epitaxialgrowth, in one process step, without vacuum break, by adapting the typeand/or the amount of precursors present in the epitaxial reactor.

The following process steps are represented in FIG. 7. The step (301)shows epitaxial growth of a first semiconductor material having ahorizontal gradient in composition, followed by the epitaxial growth ofsecond semiconductor material having a horizontal gradient incomposition. The horizontal gradient in composition (and band gap) isillustrated by the regions “A” and “B” of the first semiconductormaterial and, respectively, the region “C” and “D” of the secondsemiconductor material. As in case of FIGS. 5 and 6, the transitionbetween the two regions is not abrupt, instead the variation incomposition and band gap is gradual in a horizontal direction.

A CMP step (not shown) of the overgrown second semiconductor material isperformed. Further, STI oxide (3) etch back (recess) (303) is performedto expose the fin (1), the exposed portion of the fin is in this casemade of the second semiconductor material, which is having a horizontalgradient in composition. Subsequently, formation (304) of gate oxide (3)and gate electrode (4) around the fin in a tri-gate architecture isshown. Alternatively to (304), formation of gate oxide and gateelectrode in a dual-gate architecture (304′).

The invention claimed is:
 1. A semiconductor device comprising: asubstrate, a protruding structure that is formed in a recess in thesubstrate and is extending above the recess having a buried portion andan extended portion, and wherein at least the extended portion comprisesa semiconductor material having an inverted ‘V’ band gap profile with aband gap value increasing gradually from a first value at lateral edgesof the structure to a second value, higher than the first value, in acenter of the structure.
 2. The device of claim 1, wherein both theextended portion and the buried portion comprise a semiconductormaterial having an inverted ‘V’ band gap profile.
 3. The device of claim1, wherein the semiconductor material further comprises dopants.
 4. Thedevice of claim 1, wherein the protruding structure comprises two ormore layers, the layers being stacked vertically and wherein each layercomprises a semiconductor material having an inverted ‘V’ band gapprofile with a band gap value increasing gradually from a first value atthe lateral edges of the structure to a second value higher than thefirst value in the center of the structure.
 5. The device of claim 1,wherein the recess has a bottom area that exposes the substrate andlateral walls comprising a dielectric material.
 6. The device of claim5, wherein the substrate is silicon and the dielectric material issilicon oxide.
 7. The device of claim 1, wherein the semiconductormaterial of the protruding structure comprises silicon germanium (SiGe)and the band gap profile is created by a gradient in Ge concentration,with a highest Ge concentration at the lateral edges of the protrudingstructure.
 8. The device of claim 7, wherein Ge concentration at thelateral edges is between 60 at % and 100 at %.
 9. The device of claim 7,wherein Ge concentration in the center is between 40 at % and 60 at %.10. The device of claim 1, wherein the protruding structure forms a fin.11. The device of claim 10, wherein a multiple gate is formed around thefin.
 12. The device of claim 10, wherein the fin further comprises acapping layer formed conformal around the extended portion of theprotruding structure.
 13. The device of claim 12, wherein the cappinglayer is made of SiGe or Ge, wherein SiGe has a Ge concentration higherthan 60 at %.